Brand:

Ti2-i Microscope

SKU: Ti2-i

Elevate your imaging workflow with the ECLIPSE Ti2-i, designed for effortless precision in ICSI and advanced live-cell applications.


One-Touch Mode Switching

Simplify complex microscope operations by switching registered observation modes with a single programmable button press.

High-Quality Optics for Critical Structures

Nikon’s advanced objectives and polarised light techniques enable clear colour-coded imaging of spindles and fine sperm structures.

Ergonomic & Space-Efficient Design

Adjustable eyepiece height and built-in motor unit control box help maintain comfortable posture and maximise clean-bench space.

Consistent Illumination Management

The Light Intensity Management (LIM) function automatically records and reproduces optimal brightness when changing magnifications or modes.

Clear Status Display & Error Alerts

An intuitive LCD panel shows current microscope settings and warns if configurations don’t match stored modes, reducing operational mistakes.

Parameter ECLIPSE Ti2-I
Optics
Optical systemCFI60 infinity optical system
Field number22
Intermediate magnificationManual switching of 1.0× / 1.5× with status detection
Output port4 manual positions with status detection:
Eyepiece 100%, left 100%, right 100%
Eyepiece 60%, left 40%
Focusing
Focusing unitCoarse/fine focusing knob
Coarse motion torque adjustable
With refocusing mechanism
Stroke: up 4 mm, down 3 mm
Illumination
LED lamphouseHigh power LED for dia illumination
Pillar for dia illuminationCondenser vertical stroke: 66 mm
Backward tilting up to 25°
With field diaphragm and refocusing mechanism
Body & structure
Tube (field number 22)Binocular S tube, Ergonomic ER tube
Condenser7 motorised positions (ø37 mm × 4, ø39 mm × 3)
Nosepiece6 motorised positions, with DIC prism slots
Cube turret6 motorised positions
Spindle observation system2 motorised positions
Stage
Stage stroke rangeAdjustable in 3 levels with adjusting pin:
X × Y: ±57 × ±36.5 mm
X × Y: ±36.5 × ±25 mm
X × Y: ±9 × ±9 mm
Observation
Observation methodsBrightfield, NAMC, IMSI*, Spindle observation*
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